From Raw Samples to Light Microscope Analysis – The Full Workflow for Industrial Research


Cross-sectioning with the Leica EM TXP is performed to prepare industry samples for imaging and chemical analysis with Laser-Induced Breakdown Spectroscopy. This integrated workflow allows pinpointing and easy preparation of barely visible targets in a few minutes.

Join us for our demo session and gain insights into handling challenging samples and getting quality images and analysis results with minimum effort.

Leica Webinar - From Raw Samples to Light Microscope Analysis


Agenda – Session includes demos to further enhance your experience with our products:

  • Introduction to Sample Preparation Solutions
  • Introduction to High-quality Imaging Solutions
  • Question & Answer Session


​​​​Date:              20 Jan 2022, Thursday
Time:              2:00 PM SGT

  • Veronique Teo, Leica Microsystems
  • Angela Hu, Leica Microsystems



  • Fast and targeted x-section material samples
  • Create precise and reproducible images and data
  • Enhance work efficiency by 90% with 2-in-1 Visual & Chemical Material Inspection